cerca per filtri
Ultrafresa EM TXP Leica

The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.

An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets; with the specimen pivot arm the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule.

For research use only

Tecnolabor S.r.l. | Via Panà, 56/b | 35027 NOVENTA PADOVANA (PD)
Tel. 049/8703700 | Fax 049/8703642 | P.Iva 01008540286 | info@tecnolabor.it
credits
© Copyright 2012